Nano Resolution Imaging System: STED/TIRF Nanoscopy, STED+2PP Laser Direct Lithography
Solid State LiDAR(Light Detection And Ranging) Sensor
Novel Stereo Lithographic Apparatus for High Resolution 3D Printers
Free-form Optics Design for Laser Scanners
대표 연구 결과
W. Kim et al., “Enhanced lateral resolution in continuous wave stimulated emission depletion microscopy using tightly focused annular radially polarized excitation beam”, J. Biophotonics.2019;12:e201900060.
W. Kim et al., “Investigation on improvement of lateral resolution of continuous wave STED microscopy by standing wave illumination”, Opt. Express, Vol. 26(8), 9901-9919 (2018)
W. Kim et al., “Analysis of the Diffracted Field Near the Focal Region due to the Birefringence of the Field Flattening Lens of the Laser Scanning System”, Polymer Testing 66, (2018) 221–227 (2018)
W. Kim et al., “Investigation on achieving super-resolution by solid immersion lens based STED microscopy”, Opt. Express, Vol. 25, No. 14, pp. 16629-16642 (2017)
W. Kim et al., “Feasibility study of the application of radially polarized illumination to solid immersion lens-based near-field optics,” Opt. Lett. 34, 1961-1963 (2009)
W. Kim et al., “Effects of optical variables in immersion lens-based near-field optics”, Opt. Express Vol. 16, 13933-13948 (2008).
US8786656B2, “Lens array, linear light exposure device, and optical apparatus employing the linear light exposure unit”.
US8922614B2, “Light scanning unit and image forming apparatus including the same”.
US9229354B2, “Luminous flux limit device, optical scanning unit employing the same, and electrophotographic image forming apparatus”.
US9365050B2, “Light-emitting element array module and method of controlling light- emitting element array chips”.